Date of Award
1-1-2007
Degree Type
Thesis
Degree Name
M.A.Sc.
Department
Electrical and Computer Engineering
Keywords
A, ELECTRON, LOGIC, MODEL, RELIABILITY, SINGLE, STATISTICAL, THRESHOLD
Rights
Recommended Citation
Mao, Yanjie, "A statistical reliability model for single-electron threshold logic." (2007). Electronic Theses and Dissertations. 6967.
https://scholar.uwindsor.ca/etd/6967
COinS