Date of Award
1-1-2007
Publication Type
Master Thesis
Degree Name
M.A.Sc.
Department
Electrical and Computer Engineering
Keywords
A, ELECTRON, LOGIC, MODEL, RELIABILITY, SINGLE, STATISTICAL, THRESHOLD
Rights
info:eu-repo/semantics/openAccess
Creative Commons License
This work is licensed under a Creative Commons Attribution-NonCommercial-No Derivative Works 4.0 International License.
Recommended Citation
Mao, Yanjie, "A statistical reliability model for single-electron threshold logic." (2007). Electronic Theses and Dissertations. 6967.
https://scholar.uwindsor.ca/etd/6967
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