Date of Award

2016

Degree Type

Thesis

Degree Name

M.Sc.

Department

Electrical and Computer Engineering

First Advisor

Chen, Chunhong

Keywords

reliability, reliability analysis, signal correlations, The improved equivalent reliability model, The improved Monte Carlo simulation, Three-point method

Rights

CC BY-NC-ND 4.0

Abstract

Reliability of logic circuits is becoming one of important concerns in the modern integrated circuit design. A large number of inputs and signal correlations make reliability analysis of logic circuits computationally expensive. Many reliabilities analysis approaches have been proposed. Monte-Carlo simulation usually requires hours to obtain a high precision result. Probabilistic gate models (PGM) just work perfectly for small circuits or correlation-free circuits. Probability transfer matrices (PTM) and Bayesian network techniques can give the accurate evaluations, but may become very time-consuming and intractable for larger circuits. This thesis presents three new methods of reliability analysis for large-scale circuits: (1) The improved equivalent reliability model (2) Three-point method (3) The improved Monte Carlo simulation. They can increase the evaluation efficiency and accuracy compared to the other existing approaches. These results are supported by extensive simulations.

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