Date of Award
2011
Publication Type
Master Thesis
Degree Name
M.A.Sc.
Department
Electrical and Computer Engineering
Keywords
Electrical engineering.
Supervisor
Ahmadi, Majid (Electrical and Computer Engineering)
Rights
info:eu-repo/semantics/openAccess
Creative Commons License
This work is licensed under a Creative Commons Attribution-NonCommercial-No Derivative Works 4.0 International License.
Abstract
This thesis presents a new readout circuit with integrated Built-in Self-Test (BIST) structure for capacitive Micro-Electro-Mechanical Systems (MEMS). In the proposed solution instead of commonly used voltage control signals to test the device, charge control stimuli are employed to cover a wider range of structural defects. The proposed test solution eliminates the risk of MEMS structural collapse in the test phase. Measurement results using a prototype fabricated in TSMC 65nm CMOS technology indicate that the proposed BIST scheme can successfully detect minor structural defects altering MEMS nominal capacitance.
Recommended Citation
Basith, Iftekhar, "Built-In Self-Test Solution for CMOS MEMS Sensors" (2011). Electronic Theses and Dissertations. 114.
https://scholar.uwindsor.ca/etd/114
