A statistical reliability model for single-electron threshold logic.

Author

Yanjie Mao, University of Windsor

Date of Award

1-1-2007

Publication Type

Master Thesis

Degree Name

M.A.Sc.

Department

Electrical and Computer Engineering

Keywords

A, ELECTRON, LOGIC, MODEL, RELIABILITY, SINGLE, STATISTICAL, THRESHOLD

Rights

info:eu-repo/semantics/openAccess

Creative Commons License

This work is licensed under a Creative Commons Attribution-NonCommercial-No Derivative Works 4.0 International License.

Recommended Citation

Mao, Yanjie, "A statistical reliability model for single-electron threshold logic." (2007). Electronic Theses and Dissertations. 6967.
https://scholar.uwindsor.ca/etd/6967